طراحی latch فناوری cmos - مقاله ترجمه شده

عنوان فارسی مقاله:	طراحی یک latch چفت شده کم هزینه و با تشعشع قابل اطمینان بالا توسط فناوری 66nm CMOS
عنوان انگلیسی مقاله:	Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology

برای دانلود رایگان مقاله انگلیسی طراحی یک latch چفت شده کم هزینه و با تشعشع قابل اطمینان بالا توسط فناوری 66nm CMOS و خرید ترجمه فارسی آن با فرمت ورد اینجا کلیک نمایید

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جستجوی ترجمه مقالات بر اساس کلمات کلیدی

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• فهرست مطالب:

خلاصه

1. مقدمه

2. کارهای پیشین

3. طراحی latch چفت شده پیشنهادی

5. اثرات ولتاژ منبع تغذیه، درجه حرارات و پردازش

6. نتیجه گیری

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کلمات کلیدی :

Novel radiation hardened latch design considering process, voltage ...https://www.researchgate.net/.../220454246_Novel_radiation_hardened_latch_design_c...Novel radiation hardened latch design considering process, voltage and ... Moreover, PVT variations have great impact on the reliability of hardened circuit.[PDF]High performance, low cost, and double node upset tolerant latch designhttps://hal.archives-ouvertes.fr/hal-01316498/documentby A Yan - ‎2016 - ‎Related articlesMay 17, 2016 - compared with the previous radiation hardened latch designs. Keywords—single ... radiation hardening; circuit reliability. I. INTRODUCTION.A novel radiation hardened by design latch - IOPscienceiopscience.iop.org/article/10.1088/1674-4926/30/3/035007/metaby H Zhengfeng - ‎2009 - ‎Cited by 20 - ‎Related articlesDue to aggressive technology scaling, radiation-induced soft errors have become a serious reliability concern in VLSI chip design. This paper presents a novel ...[PDF]Low cost and highly reliable radiation hardened latch design in 65nm ...iranarze.ir/wp-content/uploads/2017/07/7153-English-IranArze.pdfLow cost and highly reliable radiation hardened latch design in 65 nm. CMOS technologyq. Chunhua Qi, Liyi Xiao. *. , Jing Guo, Tianqi Wang. Microelectronics ...[PDF]A novel radiation hardened by design latch - Journal of Semiconductorswww.jos.ac.cn/bdtxben/ch/reader/create_pdf.aspx?file_no=08073003by H Zhengfeng - ‎Cited by 20 - ‎Related articlesKey words: soft error; single event upset; radiation hardened by design latch .... erations and suitable for emerging variability and reliability issues[17]. The 45 nm ...